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APC System

  • +91 81208 40242
  • alexandritepowersystem@gmail.com
  • 245 Satya Dev Nagar, Indore- 452009

Distribution Transformers Test System

System

Urban development projects, including the construction of commercial and residential complexes, contributes to the need for enhanced power distribution infrastructure, thus driving the demand for distribution transformers, so the industries are manufacturing the distribution transformers on a mass scale and conducting Routine tests, which are necessary to be performed on all transformers to ensure the quality of the product.

APCS Distribution Transformer Test system is specifically designed to test distribution transformers as per international standard. Through automation and auto report generation software APCS test system will increase the productivity and reduce the testing time & human errors at the same time.

System Components

  1. Automatic Variable Voltage Source.
  2. Control Test Bench.
  3. High Voltage Transformer.
  4. HT Changeover Switches.
  5. Test Report Generation Software.

FEATURES

  • Meets the all IS, IEC, IEEE & NABL standard.
  • New compact design of HT changeover switches reducing the testing area size.
  • Through automation , It Increase s the productivity of testing by reducing the human errors.
  • Through test report generation software, It saves report generation time during testing.
  • Through auto switching of test sequences, It saves test object cable connection time during testing.
  • New compact high current HT changeover switches reduces the testing lead resistances during short circuit
    test and also improves the measurement accuracy.

Test Covered by System

Sr.No.ROUTINE TESTS
1Measurement Of Voltage Ratio and Check of Phase Displacement.
2Measurement Of Winding Resistance.
3Measurement Of Insulation Resistance.
4Measurement Of No-Load Loss and No-Load Current.
5Measurement Of Load Loss and Impedance Voltage.
6Induced Over Voltage Withstand Test.
7Separate source voltage withstand test.
Sr.No.TYPE TESTS
1Temperature rise test on lower TAP (Higher current)
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